Analysis of CD Stud Welding Process and Defects - Part 2 : Control of Void

Oh, Hyun-Seok; Yoo, Choong-D.

Journal of KWJS 2006;24(3):42-48.
Published online August 22, 2006.

CD 스터드 용접의 해석 및 결함 분석Part 2 : 기공 제어

Analysis of CD Stud Welding Process and Defects - Part 2 : Control of Void

Abstract

Since the voids occur at the CD stud welds, the mechanism of void formation and void reduction method are investigated in this work. It is speculated that the voids are formed because of high short-circuit current above 1000A. When the simple flow model is used to estimate the void trapping condition, the most voids are trapped at the weld mainly due to fast cooling rate of the CD stud weld. Since it is almost impossible to remove the voids completely, a method is proposed to reduce the void by decreasing the short-circuit current at the end of the arcing time. The experimental results show that the void is reduced by decreasing the short-circuit current to 1000A.

Key Words: CD stud welding, Void formation, Flow model, Short-circuit current