5. J. C. Ume and I. Gong, Void Inspection in Lead-free Solder Bumps on Ball Grid Array (BGA) Packages Using Laser Ultrasound Technique, Proceedings of ASME International Mechanical Engineering Congress and Exposition (IMECE 2011). Denver, USA(2011) 941–948.
6. F. Yu, J. Cui, Z. Zhou, K. Fang, R. W. Johnson, and M. C. Hamilton, Reliability of Ag Sintering for Power Semiconductor Die Attach in High-Temperature Applications,
IEEE Trans. Power Electron. 32(9) (2016) 7083–7095.
https://doi.org/ 10.1109/TPEL.2016.2631128
[CROSSREF]
7. J. H. Son, M. K. Kim, D. Y. Yu, Y. Ho Ko, J. W. Yoon, C. W. Lee, Y. B. Park, and J. H. Bang, Thermal Aging Characteristics of Sn-xSb Solder for Automotive Power Module,
J. Weld. Join. 35(5) (2017) 38–47.
https://doi.org/10.5781/JWJ.2017.35.5.6
[CROSSREF]
13. J. H. Ahn, K. S. Kim, Y. C. Lee, Y. I. Kim, and S. B. Jung, Regulation in Shear Test Method for BGA of Flip-Chip Packages, J. Microelectron. Packag. Soc. 17(3) (2010) 1–9.
14. J. Jiu, H. Zhang, S. Nagao, T. Sugahara, N. Kagami, Y. Suzuki, Y. Akai, and K. Suganuma, Die-Attaching Silver Paste Based on a Novel Solvent for High-Power Semiconductor Devices,
J. Mater. Sci. 51(7) (2016) 3422–3430.
https://doi.org/10.1007/s10853-015-9659-8
[CROSSREF]
16. L. Xu, J. H. L. Pang, K. H. Prakash, and T. H. Low, Isothermal and Thermal Cycling Aging on IMC Growth Rate in Lead-free and Lead-based Solder Interface,
IEEE Trans. Compon. Packag. Manuf. Technol. 28(3) (2005) 408–414.
https://doi.org/10.1109/TCAPT.2005.853593
[CROSSREF]
17. Y. D. Jeon and K. W. Paik, Studies on Ni-Sn Intermetallic Compound and P-Rich Ni Layer at the Electroless Nickel UBM-Solder Interface and Their Effects on Flip Chip Solder Joint Reliability,
Proceedings of Electronic Components and Technology Conference (ECTC 2001). Orlando, USA(2001)
[CROSSREF]
18. Y. Liu, H. Zhang, L. Wang, and X. Fan, Effect of Sintering Pressure on the Porosity and the Shear Strength of the Pressure-Assisted Silver Sintering Bonding,
IEEE Trans. Device Mater. Reliab. 18(2) (2018) 240–246.
https://doi.org/10.1109/TDMR.2018.2819431
[CROSSREF]
19. C. Chen, J. Yeom, C. Choe, G. Liu, Y. Gao, Z. Zhang, B. Zhang, D. G. Kim, and K. Suganuma, Necking Growth and Mechanical Properties of Sintered Ag Particles with Different Shapes Under Air and N
2 Atmosphere,
J. Mater. Sci. 54(20) (2019) 13344–13357.
https://doi.org/10.1007/s10853-019-03813-0
[CROSSREF]
21. W. I. Seo, Y. H. Ko, Y. H. Kim, and S. H. Yoo, Void Fraction of a Sn-Ag-Cu Solder Joint Under-neath a Chip Resistor and its Effect on Joint Strength and Thermomechanical Reliability,
J. Mater. Sci. Mater. Electron. 30(17) (2019) 15889–15896.
https://doi.org/10.1007/s10854-019-01935-4
[CROSSREF]
22. C. Chen, K. Suganuma, T. Iwashige, K. Sugiura, and K. Tsuruta, High-Temperature Reliability of Sintered Microporous Ag on Electroplated Ag, Au, and Sputtered Ag Metallization Substrates,
J. Mater. Sci. Mater. Electron. 29(3) (2018) 1785–1797.
https://doi.org/10.1007/s10854-017-8087-8
[CROSSREF]
23. K. S. Moon, H. Dong, R. Maric, S. Pothukuchi, A. Hunt, Y. Li, and C. P. Wong, Thermal Behavior of Silver Nanoparticles for Low-Temperature Interconnect Applications,
J. Electron. Mater. 34(2) (2005) 168–175.
https://doi.org/10.1007/s11664-005-0229-8
[CROSSREF]
24. X. Wang, Y. Mei, X. Li, M. Wang, Z. Cui, and G. Q. Lu, Pressureless Sintering of Nanosilver Paste as Die Attachment on Substrates with ENIG Finish for Semiconductor Applications,
J. Alloys Compd. 777 (2019) 578–585.
https://doi.org/10.1016/j.jallcom.2018.10.294
[CROSSREF]