Fabrication and Reliability Test of Device Embedded Flexible Module
Dae Gon Kim, Sung Taik Hong, Deok Heung Kim, Won Sik Hong, Chang-Woo Lee
Journal of KWJS. 2013;31(3):84-88.   Published online 2013 Jun 30     DOI: https://doi.org/10.5781/KWJS.2013.31.3.84
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