Effects of the Electroless Ni-P Thickness and Assembly Process on Solder Ball Joint Reliability |
Ji-Hye Lee, Seok-Hwan Huh, Gi-Ho Jung, Suk-Jin Ham |
Correspondence:
Seok-Hwan Huh, Email: shhuh12@gmail.com |
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Abstract |
The ability of electronic packages and assemblies to resist solder joint failure is becoming a growing concern.
This paper reports on a study of high speed shear energy of Sn-4.0wt%Ag-0.5wt%Cu (SAC405) solder with
different electroless Ni-P thickness, with HNO3 vapor’s status, and with various pre-conditions. A high
speed shear testing of solder joints was conducted to find a relationship between the thickness of Ni-P
deposit and the brittle fracture in electroless Ni-P deposit/SAC405 solder interconnection. A focused ion
beam (FIB) was used to polish the cross sections to reveal details of the microstructure of the fractured
pad surface with and without HNO3 vapor treatment. A scanning electron microscopy (SEM) and an energy
dispersive x-ray analysis (EDS) confirmed that there were three intermetallic compound (IMC) layers at the
SAC405 solder joint interface: (Ni,Cu)3Sn4 layer, (Ni,Cu)2SnP layer, and (Ni,Sn)3P layer. The high speed
shear energy of SAC405 solder joint with 3μm Ni-P deposit was found to be lower in pre-condition
level#2, compared to that of 6μm Ni-P deposit. Results of focused ion beam and energy dispersive x-ray
analysis of the fractured pad surfaces support the suggestion that the brittle fracture of 3μm Ni-P deposit
is the result of Ni corrosion in the pre-condition level#2 and the HNO3 vapor treatment. |
Key Words:
High speed shear energy, Electroless Ni-P, HNO3 vapor treatment, Ni corrosion |
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